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6N POLYCRYSTALLINE SILICON CHUNK SPECIFICATIONS
Item |
Unit |
Parameter |
Testing/Analysis Method |
P-type Resistivity |
(ohm.cm) |
200-500 |
KDY-2 Resistivity/Resistance Meter |
Boron |
ppba |
0.5-1.2 |
LT-FTIR |
N-type Resistivity |
Ohm.cm |
2-25 |
KDY-2 Resistivity/Resistance Meter |
Donor |
ppba |
3 |
LT-FTIR; ICP-MS |
N-type minority electron carrier lifetime |
uS |
100 min. |
LT-IC Lifetime Tester |
Carbon content |
at/cm3 |
0.5x1016 max. |
FTIR |
Oxygen content |
at/cm3 |
1.0x1017 max. |
FTIR |
Total metal impurity (Fe, Cr, Ni, Cu, Zn, Na, K, Ca) |
ppmw |
0.05-0.5 max. |
ICP-MS |
Status |
Surface |
Grey, Luster free, rough |
Visual observation |
Section |
Oxidized layer free |
Optical microscope |
|
Others |
|
|
|
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Sales Hotline:
For product detail and price quote, please contact us:
Phone:
(86-10) 82070680
Fax: (86-10) 82070690
E-mail: sales@sinosi.com
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